OCM 2019: 4th International Conference on Optical Characterization of Materials

Beyerer, Jürgen; Puente León, Fernando; Längle, Thomas

doi:10.5445/KSP/1000087509

Proceedings Fri Mar 15 2019 CC BY-SA 4.0

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OCM 2019 : 4th International Conference on Optical Characterization of Materials

Beyerer, Jürgen ; Puente León, Fernando ; Längle, Thomas

Each material has its own specific spectral signature independent if it is food, plastics, or minerals. During the conference we will discuss new trends and developments in material characterization. You also will be informed about latest highlights to identify spectral footprints and their realizations in industry.

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Using hybrid information of colour image analysis and SWIR-spectrum for high-precision analysis of construction and demolition waste

p. 55

Kuritcyn, Petr; Anding, Katharina; Linß, Elske; Notni, Gunther
Optical characterization with filter-on-chip CMOS sensor-systems

p. 111

Dittrich, Paul-Gerald; Radtke, Lisa; Zhang, Chen; Guo, Siyi; Buch, Benjamin; Rosenberger, Maik; Notni, Gunther

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10.5445/KSP/1000087509
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OCM 2019 : 4th International Conference on Optical Characterization of Materials

Content

Using hybrid information of colour image analysis and SWIR-spectrum for high-precision analysis of construction and demolition waste

Optical characterization with filter-on-chip CMOS sensor-systems

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