3 documents found

Dissertation
All rights reserved
2018-12-07

Realisierung der Steuerungs-/Regelungsalgorithmen mittels FPGA für ein...

Die Entwicklungen des Rasterkraftmikroskops (AFM: atomic force microscope) betrafen alle seine Komponenten, angefangen von Kraftsensoren, Regelungstechniken, Materialien, und Ausrüstung bis zu den Betriebsmoden. Die meisten dieser Entwicklungen haben das Ziel, die Auflösung des AFM zu verbessern und...
Article / Chapter
CC BY 4.0
2018-11-14

Charged particle single nanometre manufacturing

Following a brief historical summary of the way in which electron beam lithography developed out of the scanning electron microscope, three state-of-the-art charged-particle beam nanopatterning technologies are considered. All three have been the subject of a recently completed European Union Project...
Frankfurt, M.: Beilstein-Institut zur Förderung der Chemischen Wissenschaften, 2018-11-14
Article / Chapter
CC BY 4.0
2017-11-03

Review Article: Active scanning probes: a versatile toolkit for fast imaging...

With the recent advances in the field of nanotechnology, measurement and manipulation requirements at the nanoscale have become more stringent than ever before. In atomic force microscopy, high-speed performance alone is not sufficient without considerations of other aspects of the measurement task,...
Published: New York, NY, 2017-11-03