Possible Polarization Measurements in Elastic Scattering at the Gamma Factory Utilizing a 2D Sensitive Strip Detector as Dedicated Compton Polarimeter

GND
1310761094
ORCID
0000-0001-8105-4657
Affiliation
Institute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 Jena 07743 Germany
Middents, Wilko;
Affiliation
Helmholtz Institute Jena Fröbelstieg 3 Jena 07743 Germany
Weber, Günter;
Affiliation
GSI Helmholtzzentrum für Schwerionenforschung GmbH Planckstraße 1 Darmstadt 64291 Germany
Spillmann, Uwe;
Affiliation
Institut für Kernphysik Forschungszentrum Jülich Wilhelm‐Johnen‐Straße Jülich 52425 Germany
Krings, Thomas;
GND
1261597214
Affiliation
Institute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 Jena 07743 Germany
Vockert, Marco;
Affiliation
School of Physics and Engineering ITMO University Kronverskiy pr. 49 St. Petersburg 1979034 Russia
Volotka, Andrey;
Affiliation
Fundamental physics for metrology Physikalisch Technische Bundesanstalt Braunschweig D‐38116 Germany
Surzhykov, Andrey;
GND
1156630649
Affiliation
Institute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 Jena 07743 Germany
Stöhlker, Thomas

For photon energies from several 10 keV up to a few MeV Compton polarimetry is an indispensable tool to gain insight into subtle details of fundamental atomic radiative processes. Within the SPARC collaboration several segmented semiconductor detectors are developed that are well suited for application as efficient Compton polarimeters. In this report, these recent developments are reviewed and it is discussed how Compton polarimetry can be employed at the upcoming Gamma Factory.

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