Advanced Materials Interfaces

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1. 2024

   • Probing the Interfacial Molecular Structure of a Co‐Prussian Blue In Situ

     Bera, Anupam; De, Ratnadip; Schmidt, Heiner; Leistenschneider, Desirée; Ulusoy Ghobadi, Turkan Gamze; Oschatz, Martin; Karadaş, Ferdi; Dietzek‐Ivanšić, Benjamin

   • Ion Irradiation‐Induced Sinking of Ag Nanocubes into Substrates

     Choupanian, Shiva; Möller, Wolfhard; Seyring, Martin; Pacholski, Claudia; Wendler, Elke; Undisz, Andreas; Ronning, Carsten
2. 2023

   • Superconductivity of K‐Intercalated Epitaxial Bilayer Graphene

     p. 1

     Huempfner, Tobias; Otto, Felix; Forker, Roman; Müller, Paul; Fritz, Torsten
3. 2022

   • Tapered cross section photoelectron spectroscopy provides insights into the buried interfaces of III‐V semiconductor devices

     Maheu, Clément; Zare Pour, Mohammad Amin; Damestoy, Iban; Ostheimer, David; Mellin, Maximilian; Moritz, Dominik C.; Paszuk, Agnieszka; Jaegermann, Wolfram; Mayer, Thomas; Hannappel, Thomas; Hofmann, Jan P.

   • Electrical properties of the base-substrate junction in freestanding core-shell nanowires

     Koch, Juliane; Liborius, Lisa; Kleinschmidt, Peter; Weimann, Nils; Prost, Werner; Hannappel, Thomas

   • Flash‐Lamp Processing of Charge Extraction Layers for Polymer Solar Cells

     p. 1

     Sokeng Djoumessi, Aurelien; Madalaimuthu, Jose Prince; Alam, Shahidul; Anand, Aman; Sichwardt, Anastasia; Fischer, Peter; Rösch, Roland; Schubert, Ulrich S.; Hoppe, Harald
4. 2021

   • Effect of SiO2 interlayer thickness in Au/SiO2/Si multilayer systems on Si sources and the formation of Au-based nanostructures

     Li, Feitao; Oliva Ramírez, Manuel; Wang, Dong; Schaaf, Peter

   • Contamination-assisted rather than metal catalyst-free bottom-up growth of silicon nanowires

     Dashtestani, Ashkan Djaberi; Moeinian, Ardeshir; Biskupek, Johannes; Strehle, Steffen

   • Contamination‐Assisted Rather Than Metal Catalyst‐Free Bottom‐Up Growth of Silicon Nanowires

     p. 1

     Dashtestani, Ashkan Djaberi; Moeinian, Ardeshir; Biskupek, Johannes; Strehle, Steffen