White light interferometry is a key technology in optical measurements and surface reconstruction. Depending on the amount of the raw data the acquisition and processing is a time-consuming process. Furthermore, the amount of raw data can easily exceed several gigabytes of memory. Particularly on embedded devices it is necessary to compress the raw data. This results in scattered data which must be processed. Depending on the compression algorithm arrangements must be made. Especially detecting the zero passages of the interferogram results in trouble. Common reconstruction algorithms fail in this case. Here a fast and scalable algorithm will be presented. Major improvements are resource efficiency and exact surface reconstruction. Additionally, optimizing the resulting bandwidth and processing time increases the user experience.