Ultrastable metrology laser at 633 nm using an optical frequency comb

Category

Conference:

Optical Micro- and Nanometrology, Strasbourg, 2018.04.25-26

Published in:

Optical Micro- and Nanometrology VII : 25-26 April 2018, Strasbourg, France
(26.07.2018), art. 106780S

Date Issued:

26.07.2018

DOI:

10.1117/12.2306907

PPN:

1030643601

Language:

English

Type of Resource:

Text

Extent:

insg. 12 Seiten

DDC subject of DNB:

670 Manufacturing

Hosting institution:

Technische Universität Ilmenau, Fakultät für Maschinenbau

statement of responsibility:

Paul Köchert, Ulrike Blumröder and Eberhard Manske