A self-optimizing framework for developing metrology software on massive parallel processor architectures

Quote

Citation style:

Beier, Tobias: A self-optimizing framework for developing metrology software on massive parallel processor architectures. Ilmenau 2014.

Access Statistic

Total:
Downloads:
Abtractviews:
Last 12 Month:
Downloads:
Abtractviews:

open graphic

Rights

Use and reproduction:
All rights reserved

Export