000K  utf8
0100  683213938
1100  2011$c2011-12-15
1500  eng
2050  urn:nbn:de:gbv:ilm1-2011iwk-136:7
3000  Siewert, Frank
3010  Bourenkov, Gleb
3010  Buchheim, Jana
3010  Cianci, Michele
3010  Fiedler, Stefan
3010  Höft, Tobias
3010  Signorato, Riccardo
4000  High resolution slope measuring deflectometry for the characterization of ultra-precise reflective X-ray optics  [Siewert, Frank]
4060  9 Seiten
4950  https://nbn-resolving.org/urn:nbn:de:gbv:ilm1-2011iwk-136:7$xR$3Volltext$534
4961  http://uri.gbv.de/document/gvk:ppn:683213938
5051  620