Analysis and correction of errors of optical measuring systems based on CCD-sensors

Published in: Proceedings of the 14th Joint International IMEKO TC1 + TC7 + TC 13 Symposium : "Intelligent quality measurements - theory, education and training" ; in conjunction with the 56th IWK, Ilmenau University of Technology and the 11th SpectroNet Collaboration Forum ; 31. August - 2. September 2011, JenTower Jena, Germany. - Ilmenau : Univ.-Bibliothek, ilmedia, 2011. URN: urn:nbn:de:gbv:ilm1-2011imeko:2


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