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An ultra-fast on-line microscopic optical quality assurance concept for small structures in an environment of mass production

Aksit, Ishak; Bünger, Kirsten; Fassbender, Alfred; Frekers, Dieter; Götze, Christian; Kemenas, Jürgen

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Category

Conference:
Internationales Wissenschaftliches Kolloquium. Technische Universität Ilmenau, Faculty of Computer Science and Automation ; 52 (Ilmenau) : 2007.09.10-13
Publisher:
ilmedia GND
Published in:
Computer science meets automation
Vol. 52, 2007, Vol. 2 (11.09.2007), p. 293-296
Volume:
52, 2007, Vol. 2
Date Created:
11.09.2007
Date Issued:
11.09.2007
PPN:
546147208
Language:
English
Type of Resource:
Text
Extent:
18 Seiten
Place Term:
Ilmenau
Classification:
Klasse A
Classification:
für Harvesting bereitgestellt
Classification:
52. IWK (2007)
DDC subject of DNB:
004 Data processing Computer sciences
Hosting institution:
Technische Universität Ilmenau, Fakultät für Informatik und Automatisierung

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Citation style:

Aksit, Ishak / Bünger, Kirsten / Fassbender, Alfred / et al: An ultra-fast on-line microscopic optical quality assurance concept for small structures in an environment of mass production. Ilmenau 2007.

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